Technical information
- Bruker D8 Discover X-ray diffraction system (XRD)
- Cu K-alpha radiation
- Trio primary optics
- Eulerian cradle with 4" wafer holder
- PathFinder detector (variable slit and Ge(220) analyzer crystal)
- Scans: 2T/T, reflectivity, GIXRD, rocking curve, RSM
- Location: LNL Q117/118
- IMPORTANT: A special booking rule applies to single XRD measurements longer than 12 hours. Please contact tool responsible who will handle the booking of the instrument.
Tool Overview
Responsible: Peter Blomqvist
Location: Q117/118: Metrology lab
License and Booking Required: Yes
Other Links