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Technical information
  • Hitachi SU8010 Scanning Electron Microscope (SEM)
  • Cold field emission gun
  • Detectors: In-lens SE & E-T SE, STEM
  • In-situ EBIC & I-V measurements
Tool Overview

Responsible: ~ftf-pbo

Location: Room Q260, (Level 2)

License and Booking Required: Yes

Documentation

User Manuals

Process

Staff Documents

Examples - Hitachi SU8010

Other Links

Safety Information 

View on LIMS

FAQ

User Discussion Forum




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